RES 101

The RES101 is an ion beam milling device that combines the preparation of TEM, SEM and LM samples in one single bench top unit.

Many accessories like LN2 cooling device and a special holder for FIB cleaning make this system extremely versatile for all users.

Key Features

• Fully computer-controlled system
• Variable milling angle from 0° to 90°
• ALL-IN-one system with the highest level of flexibility for the user
• Load-lock system for a permanent high vacuum
• LAN capability for external operation and monitoring
• Built-in CCD camera for sample observation

Detailed Description

Fully computer-controlled system
This permits a very precise setting of the milling parameters thanks to the positioning motors used, which are fitted with incremental encoders. All parameters can be displayed in the menu and settings can easily be changed via the touch screen.

Variable milling angle from 0° to 90°
The EM RES 101 uses two ion sources arranged opposite one another, with which the samples can be processed either on one side or on both sides. The milling angle can be adjusted between 0° and 90°. With the wide range of settings for the milling angle and ion energy, practically all preparation problems for Scanning Electron, Transmission Electron and Light Microscopy can be processed..

„ALL-IN-ONE system“ with the highest level of flexibility for the user
All ion beam preparation methods can be carried out within a single unit:
- Preparation of TEM samples with single or double-sided low angle milling of the sample down to 0°
- Preparation of samples for Scanning Electron and Light Microscopy
- Surface cleaning
- Surface milling for contrast enhancement
- Processing of samples of up to 25mm diameter
- 45° and 90° slope cutting for the investigation of the vertical structure
- Various sample holders for different SEM, LM and TEM applications .

Load-lock system for a permanent high vacuum
The two-stage vacuum system consisting of a diaphragm pump and a turbo molecular pump (70l/s) creates an oil-free ultimate vacuum of <1x10-5 mbar. The measurement is carried out using an ion gauge head. The innovative computer controlled gas inlet system guarantees a stable operation of the ion sources at working pressures around 2x10-4bar The sample transfer takes place at vacuum conditions in the vacuum around 30 seconds via a vacuum load-lock.

Variable ion energy for high and low energy sample milling.

External control of the milling process via LAN
With the use of additional software, it is possible to monitor and control the milling process from another PC via a local network (LAN).