Heerbrugg, Switzerland. Leica Microsystems launches a high-precision scanning stage for stereo microscopes and macroscopes, the Leica LMT260 XY Scanning Stage. To ensure successful experiments, it offers a repeatability of 0.25 μm for samples weighing less than 0.5 kg, and of 1 μm for heavier loads of 1.5 kg. This repeatability is reached at a resolution of 5 nm. Such precision is especially interesting for users who perform time-lapse experiments such as mark and find, or multi-well screenings.
"We know that every micrometer counts when imaging several samples at different XY positions", says Dr. Björn Fuchs, Product Manager, Leica Microsystems. "The Leica LMT260 XY Scanning Stage is ideal for time-lapse experiments, but also when it comes to scanning large areas with high magnification. After the software has divided the sample into a grid, the stage moves along this grid to the points of interest." The software modules Multistep of Leica Application Suite (