EM Sample Preparation Solid State Technology
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Leica EM TIC 3X
Ion Beam Slope Cutter
Achieving high quality cross-sections of almost any material, revealing the internal structures of the sample with scarcely any deformation or damage... |
Leica EM RES101
Ion milling system
The Leica EM RES101 is a fully computer-controlled ion milling system with the highest level of user flexibility, which combines the preparation of... |
Leica EM TXP
Target Surfacing System
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by... |