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EM Sample Preparation Solid State Technology

Leica EM RES101 Leica EM TXP Leica EM TIC020
Leica EM RES101 Ion milling system

The Leica EM RES101 is a fully computer-controlled ion milling system with the highest level of user flexibility, which combines the preparation of...

Leica EM TXP Target surfacing system

The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by...

Leica EM TIC020 Triple Ion Beam Miller for Preparation of Slope Cuts

The Leica EM TIC020 Triple Ion Beam Miller  for preparation of  slope cuts allows accurate and efficient site specific...


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