EM Sample Preparation Solid State Technology


Leica EM RES101 Ion milling system The Leica EM RES101 is a fully computer-controlled ion milling system with the highest level of user flexibility, which combines the preparation of...	Leica EM TXP Target surfacing system The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by...	Leica EM TIC020 Triple Ion Beam Miller for Preparation of Slope Cuts The Leica EM TIC020 Triple Ion Beam Miller for preparation of slope cuts allows accurate and efficient site specific...