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EM Sample Preparation Solid State Technology

Leica EM TIC 3X Leica EM RES101 Leica EM TXP
Leica EM TIC 3X Ion Beam Slope Cutter

Achieving high quality cross-sections of almost any material, revealing the internal structures of the sample with scarcely any deformation or damage...

Leica EM RES101 Ion milling system

The Leica EM RES101 is a fully computer-controlled ion milling system with the highest level of user flexibility, which combines the preparation of...

Leica EM TXP Target Surfacing System

The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by...


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