Triple Ion Beam Miller for Preparation of Slope Cuts Leica EM TIC020
In August 2011 the new Leica EM TIC 3X Triple Ion-Beam Cutter was launched and replaces the Leica EM TIC020!
The Leica EM TIC020 Triple Ion Beam Miller for preparation of slope cuts allows accurate and efficient site specific sample preparation for SEM analysis.
Obtain high quality cross sections from almost any material. Sample holders allowing a sample size up to 50x50x10 mm. Minimal mechanical preparation is required. The system features three ion beams with a three axis stage and viewing microscope.
Direct contact, consulting and support
- Find your local Leica Microsystems partner
- Get quotes - profit from owning a Leica Microsystems product
- Tailored advice - learn about the benefits Leica Microsystems provides for your work situation
New Model
|