Triple Ion Beam Miller for Preparation of Slope Cuts Leica EM TIC020
The Leica EM TIC020 Triple Ion Beam Miller for preparation of slope cuts allows accurate and efficient site specific sample preparation for SEM analysis.
Obtain high quality cross sections from almost any material. Sample holders allowing a sample size up to 50x50x10 mm. Minimal mechanical preparation is required. The system features three ion beams with a three axis stage and viewing microscope.
Your Advantages
 |
 |
Integrated stereomicroscopeIntegrated stereomicroscope provides excellent optical control while milling. |
Touch panel displayTouch panel display eliminates the need for specialized user training ensuring easy operation and parameter set-up by all laboratory user. |
Triple ion sourceTriple ion source allows high-quality cross-cut sections from almost any material due to permanent ion incidence from three directions resulting in high reliability and throughput in the laboratory. |
|
Direct contact, consulting and support
- Find your local Leica Microsystems partner
- Get quotes for buying, leasing and renting - profit from owning a Leica Microsystems product
- Tailored advice - learn about the benefits Leica Microsystems provides for your work situation
Related Products
|
| Leica EM RES101 Ion milling system |