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Non-contact Measuring Systems - Surface Metrology

Confocal and interferometry are combined for high speed and high resolution measurement for surface metrology. Measure materials down to 0.1nm while getting both confocal and brightfield images. Available in multiple configurations, Leica non-contact measuring systems are specifically designed to provide fast, non-invasive analysis of micro and nano structures for a variety of technical surfaces.

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Contact a local imaging specialist for expert advice on the right non-contact measuring system for your needs and budget.