3D Optical Surface Metrology System Leica DCM 3D
The Leica DCM 3D system with dual core technology has been designed for fast, non-invasive assessment of micro and nano structures of technical surfaces, in multiple configurations.
The DCM 3D combines confocal and interferometry technology for high speed and high-resolution measurements down to 0.1nm.
And, the micro display confocal technology, with no moving parts, measures a variety of materials and provides confocal and bright field images simultaneously.
Visit our Webinar: Applications of Confocal Microscopy and Interferometry in Surface Metrology and Inspection
Your Advantages
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Confocal and InterferometryConfocal and Interferometry – dual core technology for high speed measurements and high resolution from 0.1 nm to 10 mm. |
Micro display confocal technologyMicro display confocal technology – confocal and bright field imaging of the same area simultaneously. |
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Interferometry PSI and VSIInterferometry PSI and VSI – provides the highest precision measurement of smooth surfaces with sub-nanometer resolution. |
No sample preparationFast, non-destructive 3D measurements - |
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