Data will be presented demonstrating the capability of complementary technologies such as Confocal Microscopy and Interferometry for surface metrology including a brief overview of the Leica DCM 3D combined optical metrology system.

Presenter:

Bill Henderson
Metrology Specialist, North America, Leica Microsystems, Inc

In this web seminar, you will learn:

• The benefits and limitations of confocal microscopy and interferometry in the field of surface metrology
• How complementary technologies can be combined in many applications to enhance their individual capabilities
• How powerful analysis software can generate data that provides valuable insight into the nature of the surfaces being examined

http://www.asminternational.org/webinars

Then click "Applications of Confocal Microscopy and Interferometry in Surface Metrology and Inspection"

Leica Map’s desktop reporting environment makes it easy to visualize and analyze measurement data and to generate reports with full metrological traceability.

Characterizing 3D Surface Texture and Geometry

Wetzlar, Germany / Besançon, France. Leica Microsystems and Digital Surf announced the signature of an agreement whereby Leica Map surface imaging and metrology software based upon Digital Surf's Mountains Technology® will be used with the Leica Application Suite (LAS) for Leica industrial microscopes. The new Leica Map software is used to visualize and quantify features of measured surfaces, characterize surface texture and geometry and generate visual surface metrology reports with full traceability. It is available on three levels with optional modules for advanced applications.

Entry level Leica Map Start software is used in conjunction with LAS Montage. LAS Montage acquires a series of image planes at known spacing covering the in-focus region of a specimen with a Leica microscope. From this stack a depth map and an extended focus image are derived and analyzed by Leica Map. In Leica Map Start, surface topography can be viewed at any zoom level and any angle in real time. Color and intensity image overlays facilitate the location of surface features, including defects. Distances, angles, and step heights can be measured. Height and functional parameters are calculated in accordance with the latest ISO 25178 standard on areal surface texture. Optional modules can extend the capability to surface texture and contour analysis.

Leica Map DCM 3D software is dedicated to the Leica dual core 3D microscope Leica DCM 3D, which combines confocal and interferometry technology for non-invasive, high speed, and high-resolution assessment of micro and nano structures. In addition to the standard features of Leica Map Start, Leica Map DCM 3D includes advanced ISO 16610 filtering techniques for separating surface roughness and waviness, basic functional analysis (bearing ratio, depth distribution, etc.), and the ability to extract sub-surfaces (for example from mechanical and electronic components and MEMS) and analyze them independently.

The Leica Map product range is completed by Leica Map Premium, a top of the line universal solution that is compatible with single-point tactile and optical profilometers and scanning probe microscopes, as well as with optical microscopes.

“Leica Map is an important addition to the Leica Application Suite,” stated Andreas Hedinger, Managing Director of Leica Microsystems’ Industry Division. “It provides users of Leica microscopes with a comprehensive solution for surface imaging and metrology in accordance with the latest standards and methods.”

“Leica Map software is based upon the latest generation of Mountains Technology®, which was released in the second half of 2010,” stated François Blateyron, Chief Operating Officer of Digital Surf. “It incorporates an enhanced desktop publishing environment, to speed up complex calculations and the processing of large measurement data sets.”

• Press Release Leica Map Digital Surf (English)
• Press Release Leica Map Digital Surf (German)
• Press Release Leica Map Digital Surf (French)

_ _ _ _ _ _ _ _ _ _ _ _ _ _ _

This is Leica Microsystems

Leica Microsystems is a world leader in microscopes and scientific instruments. Founded as a family business in the nineteenth century, the company’s history was marked by unparalleled innovation on its way to becoming a global enterprise.

Its historically close cooperation with the scientific community is the key to Leica Microsystems’ tradition of innovation, which draws on users’ ideas and creates solutions tailored to their requirements. At the global level, Leica Microsystems is organized in four divisions, all of which are among the leaders in their respective fields: the Life Science Division, Industry Division, Biosystems Division and Medical Division.

Leica Biosystems, an own operating company, offers histopathology laboratories the most extensive product range with appropriate products for each work step in histology and for a high level of productivity in the working processes of the entire laboratory.

The company is represented in over 100 countries with 12 manufacturing facilities in 7 countries, sales and service organizations in 19 countries and an international network of dealers. The company is headquartered in Wetzlar, Germany.

_ _ _ _ _ _ _ _ _ _ _ _ _ _ _

Digital Surf, founded in 1989, is a leading provider of imaging and analysis software for surface metrology instruments including confocal microscopes, optical interferometric microscopes, scanning probe microscopes and 2D/3D profilometers. Imaging and analysis software based on Digital Surf’s Mountains® technology is integrated by leading instrument manufacturers and is used in thousands of laboratories and industrial facilities working in numerous sectors including aerospace, automotive, cosmetics, energy, MEMS, materials research, medical, metallurgy, nanostructures, optics, paper, PCB, plastics, polymers, printing, semiconductor, etc.

The Leica DCM 3D Measuring Microscope combines confocal microscopy and interferometry in one sensor head, providing ultrafast and non-contact analysis of the micro- and nanogeometry of material surfaces to an accuracy of 0.1 nanometer.

Leica DCM 3D Measuring Microscope Combines Confocal Microscopy and Interferometry for Contact-Free Surface Measurement

Terrassa, Spain / Heerbrugg, Switzerland. Sensofar-Tech, Terrassa, Spain and Leica Microsystems (Schweiz AG) have agreed to expand their cooperation whereby Sensofar is to supply technology and components for an optical system that complements Leica’s line of products for industrial applications. Leica Microsystems will utilize the Sensofar technology plus Leica Microsystems’ high-end optical objectives to provide a new and complete solution for sophisticated optical profiling and 3D surface metrology with a vertical accuracy down to 0.1nm.

The Leica DCM 3D Dual Core 3D Measuring Microscope combines confocal microscopy, interferometry and color imaging in one sensor head. Due to two LED light sources and the innovative confocal microdisplay technology without mechanically moving parts, the measurement system is nearly maintenance-free. Features such as the compact, robust design, high-end optics from Leica Microsystems, a 17mm vertical scanning range and an outstanding vertical resolution down to 0.1nm makes the Leica DCM 3D an exceptionally powerful tool for non-contact, highly precise and ultra fast analysis of micro- and nanogeometries of technical surfaces. The system is suitable for a wide variety of measuring applications in R&D and quality assurance labs all the way through to automated online process control.

The cooperation between Sensofar and Leica Microsystems stems from a successful pilot project that was launched for the European market in 2008. Even during the initial pilot phase, several Leica DCM 3D systems found interested buyers for a range of applications. The two companies now plan to expand their cooperation, venture into additional markets and continue their joint development efforts.

Press Release Leica DCM 3D & Sensofar (English)

Press Release Leica DCM 3D & Sensofar (German)

More about Sensofar

Innovative Technologies for 3D Surface Analysis and Particle Measurement.

Wetzlar, Germany. At CONTROL 2010, Leica Microsystems is presenting its new series of digital microscopes Leica DVM2000-5000, the Dual-Core 3D Measuring Microscope Leica DCM 3D with combined confocal and interferometry technology, the Leica Cleanliness Expert for particle analysis and the Leica Ergoscope for an easy start to the world of high-definition microscopy.

Digital Microscopy – The New Reference for Speed and Mobility

The digital microscopes Leica DVM2000-5000 open up new horizons of speed and mobility, meeting the highest specifications for macro- and microscopic imaging and image processing – whether for 2D or demanding 3D surface analysis. The streamlined zoom optics even reach extremely difficult-to-access surfaces for non-destructive inspection of stationary parts. The Leica DVM5000, including the optics, monitor, and computer, can convert into a compact, portable system with just a few adjustments.

Combined Precision – Nanometer Accuracy Within Seconds

The Dual-Core 3D Measuring Microscope Leica DCM 3D for contact-free 3D surface measurement combines confocal microscopy, interferometry and color imaging in one sensor head, offering ultrafast and contact-free analysis of the micro- and nanogeometry of material surfaces to an accuracy of 0.1 nanometer. A confocal microdisplay positioned in the field diaphragm, two light sources and two high-resolution CCD cameras produce unlimited field depth and highly precise 3D results. The system requires no mechanically moving parts and is therefore practically maintenance-free.

Particle and Fiber Measurement to the Latest Standards

Leica Cleanliness Expert is the ideal solution for quantitative cleanliness analysis in the automobile industry and many others. Impurities on micromechanic components are measured to the latest quality standards. The totally redesigned all-in-one system consists of an automated incident light microscope, a digital camera and image analysis software. Fibers and particles are detected in the live image and reflecting particles can be differentiated from non-reflecting ones. It is also possible to measure the height for selected particles. Also, a new scanning algorithm allows the user to detect any size of fibers and particles and reclassify them in the list of results.

Direct On-screen Assessment of Live HD Images

Consisting of the Leica IC80 HD high-definition camera and the Leica M50 or M80 Stereomicroscope, the Leica Ergoscope provides the easiest imaginable start to high-definition microscopy. Components are assessed live on the high-resolution monitor. The full HD image provides all the necessary information for fast and accurate assessment – while the user is able to sit in a relaxed, ergonomical position. The Leica IC80 HD can work as a stand-alone solution or in connection with a computer. If a stereoscopic view of the sample is required, ergonomic viewing tubes can be used to adapt the viewing height to the individual user.

Leica Microsystems at CONTROL 2010: Hall 1, Booth 1115

• Press Release Leica Control 2010 (English)
• Press Release Leica Control 2010 (German) 

Dr. Matthias Nüchter from the Nanoinitiative Bavaria (front) and Dr. Carola Troll from Leica Microsystems (right) at the delivery of the Leica DCM 3D for the NanoShuttle. Media representatives and students were also invited to attend this event.

With the Leica DCM 3D students explored the surface structure of pine pollen. One grain has a diameter of 40 µm.

Gerbrunn, Germany. What is nanotechnology? What career opportunities does this rapidly developing field offer? One of the central objectives of the Nanoinitiative Bavaria, which operates under the umbrella of the Bavarian Cluster Nanotechnology, is to inform and educate teachers and students.

Be astonished today, do research tomorrow

Every year, the Nanoinitiative Bavaria holds a competition for schools to give students an opportunity to prove their resourcefulness. Leica Microsystems is sponsoring this year’s competition. Students of all grammar schools, secondary schools and technical colleges in Bavaria are eligible to submit projects, coursework or individual contributions. The only rule is that the entry should deal with the subject of nanotechnology in an informative, enlightening, humorous or innovative way.

Science on Tour

An important element of the student program is the ‘NanoShuttle’ packed with high-tech analysis and presentation equipment that has traveled from school to school in Bavaria for more than two years. Since September 2009, the NanoShuttle, which is equipped with an atomic force microscope and a particle analyzer, has also featured a Leica DCM 3D.

The NanoShuttle reaches approximately 15,000 students per year. “The interested students of today will be the scientists and entrepreneurs of tomorrow,” says Dr. Matthias Nüchter, member of management of the Cluster Nanotechnology Bavaria. “This is why we want to generate interest in this key technology of the 21st century at an early stage.”

Cell phone chips and hair in nanofocus

Using the Leica DCM 3D, students look in astonishment at the surface structure of their cell phone chips, which on the nanoscale look like high mountains. Fascinated as well by nanostructures of different petals, the students also compare their own hair to industrial carbon fibers. “The Leica DCM 3D is a great addition to our NanoShuttle,” emphasizes Christoph Petschenka from the Nanoinitiative Bavaria.

Cluster Nanotechnology / Nanoinitiative Bavaria

http://www.nanoinitiative-bayern.de

Cluster Nanotechnology, Nanoinitiative Bavaria GmbH and Nanonetz Bavaria e.V.

Nanotechnology competition for schools
http://www.nanoinitiative-bayern.de/schulwettbewerb.php