News for Leica DM4000 M
parts2clean 2009: Leica Cleanliness Expert for Quantitative Particle Analysis (copy 1)
29 July 2009
Wetzlar, Germany. Quantitative cleanliness analysis is a technique which manufacturers in many industries are being forced to apply due to new quality standards. These users will welcome a new development by Leica Microsystems, the Leica Cleanliness Expert microscope system. It is an improvement on the already long-successful system for ultra reliable and accurate measurement of impurities in liquids used to clean micromechanic components.
The all-in-one system consists of a fully automated Leica DM4000 M or DM6000 M incident light microscope, a digital camera and the image analysis software. Fibers and particles of any size are detected in the live image and can be classified as reflecting or non-reflecting. The system is able to fully reproduce any number of measurement parameters and microscope and camera settings, and all the changes are documented
