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Expertise in Quantitative Metallography Leica Quantimet

From simple counting of features to measurements and complex classifications according to international standards: Quantitative Metallography comprises of a wide range of different analyses. All the more important to have the right tools at hand. Tools that will increase your efficiency at work.

Whether for quality control, incoming goods inspection or rating of liability cases, if you have to evaluate material processing steps or the quality of metallic or ceramic materials, Quantimet packages from Leica Microsystems are your software of choice.

With only a minimum amount of training, you will be able to simply perform calibrated measurements. Reliably analyse materials according to international metallographic standards or fully flexible according to your particular needs.

Quantimet Software Packages

Your Advantages

Dedicated Flexible


To comply with metallographic standards, use the dedicated tools of Quantimet. Analyse the materials of interest for Phase Percentage, Grain Size Analysis, Nodular Cast Iron, Carburization and Decarburization Depths, Layer Thickness and Dendrite Arm Spacing.


Increase the efficiency of your work by leveraging the full flexibility of a powerful image analysis tool. Create your own company specific analysis routines or even create your own automated analysis procedures using automated Leica Microscopes and the powerful macro programming of Quantimet Research.

State of the Art Versatile Reporting

State of the Art

Quantimet software modules are fully compliant with following established standards (and others) in their latest version:

Grain Size Analysis: ASTM E112, DIN EN ISO 643, JIS G0551/0552
Nodular Cast Iron: ASTM 247, ISO 945-2, JIS G5502
Decarburization Depth: ASTM E1077, DIN 50192, ISO 3887, JIS G0558
Layer Thickness: ASTM B487, ISO 1463

Versatile Reporting

Report templates can be configured to laboratory requirements using Microsoft® Excel™ to exactly match your needs. Access the large number of available measurement parameters and tailor the reports to a wide range of applications.