Warning! You won't be able to use the quotation basket until you enable cookies in your Web browser.
Warning! Your Web browser is no longer supported. Please upgrade to a modern browser.
Contact Us
Leica EM RES102 Ion Beam Milling

Ion Beam Milling System Leica EM RES102

  • Reducing the Formation of FIB-Induced FCC Layers on Cu-Zn-Al Austenite
    Eugenia Zelaya, EMAT, University of Antwerp, Belgium, and Dominique Schryvers, Consejo Nacional de Investigaciones Cientificas y Técnicas, Argentina, Microsc Res. Tech. 2011 Jan;74(1):84-91. doi: 10.1002/jemt.20877
    http://onlinelibrary.wiley.com/doi/10.1002/jemt.20877/abstract?deniedAccessCustomisedMessage=&userIsAuthenticated=false
  • Nanometer to micrometer scaled inhomogeneous etching of bulk metallic glasses by ion sputtering, J.W. Deng, K.Du, B.Wu, M.L. Sui, Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang, China, Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, China, Elsevier, Intermetallics, Volume 34, March 2013, Pages 75-82
    http://www.sciencedirect.com/science/article/pii/S0966979512004153
  • TEM Investigation of Metal/Ceramic Interfaces in AA7475/AIN or Al2O3 Nano-Composites,Solid State Phenomena (Volume 186), Electron Microscopy XIV, Marta Gajewska, Jan Dutkiewicz, Lidia Lityńska-Dobrzyńska, Jerzy Morgiel, Institute of Metallurgy and Materials Science, Polish Academy of Sciences, Rymonta 25, Poland,Solid State Phenomena (Volume 186), Electron Microscopy XIV
    http://www.scientific.net/SSP.186.202
  • Microstructures and magnetic properties of L11 CoPt thin films with additions of SiO2 and MgO, An-Cheng Suna,  Chuan-Fa Huanga, F.T. Yuanb, Jen-Hwa Hsub,  a Department of Chemical Engineering and Materials Science, Yuan Ze University, 135 Yuan-Tung Road, Chung-Li 32003, Taiwan, b Department of Physics, National Taiwan University, 1, Roosevelt Road, Sec. 4, Taipei 10617, Taiwan,
    http://www.sciencedirect.com/science/article/pii/S0040609013001521