Solar energy is becoming more and more important all around the globe. Not only is it available in unlimited supply, it also offers key advantages for protecting the climate and the environment. Every year, many thousands of solar cells are produced worldwide for new photovoltaic plants. An important criterion for quality control is 3D characterization of the light-absorbing surface. In the past, this required time-consuming SEM analysis. A Dual-Core 3D Measuring Microscope that combines confocal and interferometry technology offers non-contact, high-precision analysis of the surface texture of solar cells in a matter of seconds.
Micro-optic components are used in a host of products concerned with illumination or imaging. Quality control of these components is challenging, as inspection has to be highly accurate yet non-invasive. Combining confocal and interferometric technology, the Leica DCM 3D Measuring Microscope is equipped to characterize these components with nanometer precision and ultra fast speed, despite the fact that they often have polished and curved surfaces that are difficult to examine.
In recent years, interferometers and optical imaging profilers based on confocal technology have been competing fiercely to conquer the non-contact surface metrology market. They are both capable of accurately and reliably measuring surface topographies on a millimeter to nanometer scale. Leica Microsystems presents a complete solution which combines both confocal and interferometry techniques: the Leica DCM 3D Dual-Core 3D Measuring Microscope.