Webinar: Applications of Confocal Microscopy and Interferometry in Surface Metrology and Inspection

April 14, 2011

Data will be presented demonstrating the capability of complementary technologies such as Confocal Microscopy and Interferometry for surface metrology including a brief overview of the Leica DCM 3D combined optical metrology system.

In this web seminar, you will learn:

  • The benefits and limitations of confocal microscopy and interferometry in the field of surface metrology.
  • How complementary technologies can be combined in many applications to enhance their individual capabilities.
  • How powerful analysis software can generate data that provides valuable insight into the nature of the surfaces being examined.

View the WebEx webinar on demand:

Applications of Confocal Microscopy and Interferometry in Surface Metrology and Inspection

Speaker

 

Bill Henderson

Metrology Specialist
Leica Microsystems

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