Webinar: SEM Sample Preparation Using Ion Beam Slope Cutting

December 14, 2011

ASM International and Leica Microsystems presented this free webinar on how to achieve high quality cross-sections of any material. Revealing the internal structures of the sample with scarcely any deformation or damage remains an industry challenge. New technologies allow for production of cross sections of hard/soft, porous, heat sensitive, brittle and heterogeneous material for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations. Learn how you can achieve high quality cross-sections during this free webinar.

View the WebEx webinar on demand:

SEM Sample Preparation Using Ion Beam Slope Cutting

 

Speaker

 

Robert Ranner

Product Manager EM Specimen Preparation
Leica Microsystems, Nanotechnology Division

Robert is responsible for solid state preparation instruments. Robert has ten years application experience in industrial sample preparation for TEM, SEM.

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