| Application of Atomic Force Microscopes |
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Applications for atomic force microscopes include the visualization and measurement of surface features having nanometer sized dimensions. Research and development laboratories as well as process control environments utilise this technique.
Not all AFM applications require ultramicrotomy but one of the largest market segments, polymeric materials, does. The quality of information from an ultramicrotome-planed surface is better than with any other planing technique, no smearing, no "Comettailes", no embedded abrasive, no contamination. |
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| The AFM (Atomic Force Microscope) holders allow clamping of the specimen for surface preparation using the Leica Ultramicrotome Ul ... |
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| AFM of an impact-modified polypropylene material. The sample was prepared using the special AFM sample holder. The clamped sample ... |
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| The sample was prepared using the special AFM sample holder. The clamped sample was cryoultramicrotomed using a Leica Ultracut S w ... |
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