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Download Ion Beam Sample Preparation Booklet!

Get free Application Booklet

Learn how to facilitate and optimize your Ion Beam Milling protocols using the EM RES102

In this 40-page booklet you can get information on how to:

  • Prepare samples prior to TEM and SEM analysis for different materials such as semiconductors, ceramics metal films/sheets and much more
  • Clean, polish and remove sample surfaces
  • Conduct contrast enhancement of various materials
  • Prepare different samples with Ion Beam Slope Cutting (cross sectioning)

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