Download Ion Beam Sample Preparation Booklet!
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Learn how to facilitate and optimize your Ion Beam Milling protocols using the EM RES102
In this 40-page booklet you can get information on how to:
- Prepare samples prior to TEM and SEM analysis for different materials such as semiconductors, ceramics metal films/sheets and much more
- Clean, polish and remove sample surfaces
- Conduct contrast enhancement of various materials
- Prepare different samples with Ion Beam Slope Cutting (cross sectioning)