15th Biennial Australian Microbeam Analysis Symposium

10 Feb 07:00 – 15 Feb 16:00 UTCBrighton Savoy, Melbourne, Australia, AustraliaTradeshow

Microanalysis and imaging, with emphasis on applications, practical solutions, and recent advancements in techniques. 
Visit Leica at the Sample Preparation workshop, coordinated by Cameron Davidson, which will cover mechanical sample prep, cleaning, coating and milling of samples for EPMA, SEM, Cathodoluminescence analysis and Electron Backscatter Diffraction (EBSD) as well as inert transfer - 10 February 2019