Five-Day Workshop on EM Sample Preparation for Industrial Materials in Vienna, Austria

November 17 to 21, Leica Microsystems will hold a five-day workshop on room-temperature and cryo sample preparation techniques at Leica Microsystems’ training facility in Vienna, Austria. Get to know the full range of Leica EM sample preparation instruments for industrial materials and practice during hands-on exercises and lectures.

To achieve the best results in materials science, Leica Microsystems offers a wide range of EM sample preparation devices for electron microscopes, light microscopes, confocal microscopes and atomic force microscopes. During the five-day workshop in November, participants will have the opportunity to learn more about different techniques during lectures and demonstrations, held by several specialists in the field of sample preparation.

Bob Vastenhout from DOW Benelux BV, Netherlands, is specialized in ultramicrotomy of polymeric materials, trimming and OsO4and RuO4 staining, sectioning for optical microscopy for SEM, TEM, and AFM. Helmut Gnaegi, Product Manager of Diatome, Biel, Switzerland, developed the technique of using diamond knives for ultramicrotomy. He will talk about preparing and ultramicrotomy sectioning of ductile hard and brittle samples for TEM, SEM and AFM, trimming sectioning as well as section collection. He will also lead hands-on exercises with samples provided by the workshop participants.

Additionally, all participants will learn more about the use of mechanical preparation equipment with the Target Surfacing System Leica EM TXP for milling, grinding and polishing, the ultramicrotome Leica EM UC7 for TEM, SEM, AFM and LM examination and the cryochamber Leica EM FC7. Our specialists will also present the ion beam slope cutter Leica EM TIC 3X for SEM and the ion beam milling system Leica EM RES102.

If you are interested in the workshop, please visit our workshop page for further information.

Related Images