Metrology Specialist, North America, Leica Microsystems, Inc
In this web seminar, you will learn:
- The benefits and limitations of confocal microscopy and interferometry in the field of surface metrology
- How complementary technologies can be combined in many applications to enhance their individual capabilities
- How powerful analysis software can generate data that provides valuable insight into the nature of the surfaces being examined
Then click "Applications of Confocal Microscopy and Interferometry in Surface Metrology and Inspection"