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Free Webinar: Applications of Confocal Microscopy and Interferometry in Surface Metrology and Inspection

Presenter:

Bill Henderson
Metrology Specialist, North America, Leica Microsystems, Inc

In this web seminar, you will learn:

  • The benefits and limitations of confocal microscopy and interferometry in the field of surface metrology
  • How complementary technologies can be combined in many applications to enhance their individual capabilities
  • How powerful analysis software can generate data that provides valuable insight into the nature of the surfaces being examined

http://www.asminternational.org/webinars

Then click "Applications of Confocal Microscopy and Interferometry in Surface Metrology and Inspection"

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