How to avoid component damage and save costs using cleanliness analysis

Are you missing risky particles, which can damage a product or part and result in system failure, production downtime, or even a product recall? To avoid those massive cost factors, Leica Microsystems and Pall have put a process-driven cleanliness analysis in place. We will give you an insight into which factors are crucial for efficient component cleanliness analysis.

1. Questions to be considered beforehand to make cleanliness analysis more efficient

The aim of a quality management process is to obtain results, which are representative, accurate, and reliable. Therefore, it is important to ask yourself the following questions before implementing cleanliness analysis.

Exactly what needs to be measured?

  • Which type and size of particles should be included?
  • Which cleanliness parameters are useful for my product?
  • Which standards have to be followed?
  • Are the particles located and analyzed efficiently?
  • Are the analysis settings, results, images, data, etc. quickly and precisely documented?

In-depth information can be found in the webinar “Basics in Component Cleanliness Analysis.” Length: 32 minutes

Click here to watch it

2. How to make sure the results from component cleanliness analysis are reliable

Making sure that the results are consistent and don’t vary from user to user it is important, especially if compliance with industrial standards and procedures – whether international, regional, or internal – is crucial. Leica Microsystems and Pall will make sure that the results are safe and reliable by:

  • Incorporating into the analysis automotive industry standards like ISO 16232, VDA 19, and ISO 4406/4407
  • Measuring particles with micrometer scale accuracy (calibration with single pixel of sensor)
  • Offering a variety of illumination and image contrast methods to detect particles
  • Offering diverse methods for particle dimension analysis

Starts at the video time 9:45

3. How to determine the damage potential of particles

The critical measurements of harmful particles are their length, breadth (or width), and height. All the dimensions are measured by the Feret method which is included in the Leica image analysis software. Furthermore, the nature of the particle has to be determined. For example, is it hard, soft, metallic or non-metallic? Knowing all of these properties of the particles helps one to determine their damage potential. In general, a particle’s damage potential correlates with the conditions below:

  • Hard particles have a higher potential to cause damage than soft ones
  • Long particles can cause damage if compacted
  • Particle breadth determines if it can easily adapt to fluid flow directions
  • A greater particle height, especially when it is round and small, indicates a higher damage potential

Starts at the video time 12:55

4. How to implement a full-service component cleanliness workflow

The optimal solution for your cleanliness analysis needs from Leica Microsystems and Pall:

  • Work with flexible systems (manual, automatic, open, and upgradeable)
  • Achieve a seamless workflow
  • Define multiple user profiles (supervisor, operator, etc.)
  • Integrated, easy-to-follow workflows
  • Apply industry standards (international, regional, or internal)
  • Benefit from >30 years of expertise from a team of >10 dedicated experts

Starts at the video time 25:11

Leica Microsystems and Pall are offering to work with you to develop a customized, full-service component cleanliness workflow. Pall provides the self-contained washing cabinets, as well as the particle extraction and filtration process. Leica Microsystems provides the optical solution for analysis of particles on the filter membranes, in terms of particle location, distribution, evaluation, and identification.

5. How to know which solution best fits your needs

When choosing a Leica Microsystem solution for an efficient component cleanliness workflow, it is crucial to know which system will best serve your requirements.

Leica DMS1000 Digital Microscope - For standard and entry-level analysis

  • Fast, easy documentation with high quality encoded zoom optics
  • Faster 2D measurements with a large field of view
  • Constant image brightness over the zoom range with the Flex Aperture
  • Open platform for documentation, measurement, and analysis

Leica DM6 M Upright Materials Microscope - For standard and advanced analysis

  • Fast particle analysis workflow with a fully automated microscope system
  • Measure small and big particles in one step with high performance optics
  • Make 3D measurements easily
  • System upgrade possible for other applications and features, e.g., metallography, 2D, 3D, and mosaic image analysis, fast documentation of results and easy report generation, etc.  

Starts at the video time 30:42

For more in-depth information, check out our webinar “Basics in Component Cleanliness Analysis”.

Click here to start the webinar

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