On this years’ SEMICON West exhibition, July 8 to 10 at the Moscone Center in San Francisco, California, USA, Leica Microsystems will present the latest optical solutions for industry, including the high throughput 8" inspection and review system Leica DM8000 M with wafer loader and Leica Microsystems’ latest evolution in non-contact 3D optical surface metrology Leica DCM8. Several stereo microscopes such as the Leica A60 S for production and the stereo microscope Leica M205 Cwill also be presented at North Hall, booth #5849. Using the right ergonomic equipment can enhance your general well-being and working performance. To make your daily microscope work more relaxed, Leica Microsystems offers a broad range of adjustable tubes and ErgoModules. At the booth, Jeannie Iverson (http://vsi-consulting.com/about-vsi/meet-the-vsi-team/), Melissa Afterman (http://vsi-consulting.com/about-vsi/meet-the-vsi-team/) and Terri Schonbrod (http://vsi-consulting.com/about-vsi/meet-the-vsi-team/)from VSI Consulting will check the working posture of the visitors, doing a personalized ergonomic assessment on their working posture.
The semiconductor and wafer inspection microscope Leica DM8000 M can increase efficiency and performance in all areas of inspection. It’s easy to use from loading wafers to taking images and producing reports. It’s ergonomically designed for comfort and efficiency during the working process. The optical surface metrology systems Leica DCM 8 is designed to help you maximize efficiency and unites the advantages of High Definition confocal microscopy with interferometry into one versatile, dual-core system. Whether you are working in production or research, the Leica DCM8 delivers the accurate, repeatable metrological analysis results you need in order to optimize performance.
The Leica A60 S stereo microscope system is ideally suited for all industrial inspection, assembly and quality control tasks. It helps you to make your inspection and rework of printed circuit boards (PCBs) in the electronics industry much easier. The stereo microscope Leica M205 C with patented FusionOptics™ technology inside is the world’s first stereo microscope to offer20.5:1 zoom, resolves structural detail down to 476nm. This fully apochromatically corrected stereo microscope with integrated electronic readout of the magnification is also a perfect imaging system.
This exhibition offers a great opportunity to learn more about industrial microscopes of Leica Microsystems and how to increase efficiency and productivity at your microscope workstation. If you would like to participate, register on http://www.semiconwest.org/Participate/RegisterNow.