Leica Microsystems attends BI-MU Exhibition in Milan

Leica Microsystems will attend at this year’s BI-MU exhibition in Milan, October 4 to 8, 2016 to show how their range of microscopes, accessories and software modules can help optimize quality control and documentation in industry and materials science. Among others, visitors can get to know the Leica DVM6 digital microscope, the Leica DMi8 inverted microscope, and the Leica DM4 M and Leica DM 6 M upright materials microscopes.

The Leica DVM6 digital microscope serves users who inspect, analyze, and measure samples in quality control, quality assurance, failure analysis, research and development as well as forensics. The instrument achieves excellent image quality due to its PlanApo-corrected optics and variability of integrated illumination options. Users can work with the instrument intuitively, for example, tilting the microscope head or changing the objectives with one hand. Because of the instrument’s encoding, results are reproducible, and reports and documentations can be generated with the click of one button.

Inverted microscopes have become increasingly popular for metallography, quality assurance in medical device or microelectronics manufacturing, a wide range of inspection tasks in the automotive and aviation industries as well as materials science. Users can speed up their workflow, because working with an inverted microscope makes sample placement and change between samples faster than in upright microscopy. They can also image large and heavy samples more easily. The modular Leica DMi8 inverted microscope platform for industrial applications makes it possible for users to configure a basic microscope system now, and upgrade later as needs and applications change.

The Leica DM4 M and Leica DM6 M upright microscopes are apt tools for materials investigation. The systems are designed for imaging, measurement, and analysis of similar features across many samples and materials. While the Leica DM4 M is designed for manual routine inspection, the Leica DM6 M is capable of fully automated materials analysis. Automated functions such as the Illumination and Contrast Manager make users’ work lives easier because they reduce complex adjustments to the push of a button. Both instruments are equipped with LED illumination. For applications such as steel inclusion rating, particle analysis, phase or grain analysis as well as cleanliness analysis, users benefit from expert modules of the Leica Application Software (LAS).

Registration to BI-MU is open beginning July 4, 2016.

The exhibition takes place at Fiera Milano, Strada Statale 33 del Sempione, 28, 20017 Milan

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