Meet the Editorial Team. Today: Stefan Motyka

As Senior Product Manager, Stefan Motyka is responsible for the Product Management team of the Industry segment in Wetzlar which comprises products for microelectronics, forensics, material sciences, polarized light microscopy and metrology. Stefan studied mechanical engineering and industrial engineering and obtained a Bachelor’s degree in Japanese studies in 2010.

Stefan, you’ve been with Leica Microsystems since the year 2000 – what’s the exciting thing about your job?

As a product manager, I’m the link between sales, customer and company. This involves a lot of communication: I have to know about cultural differences and specific types of behavior and react appropriately. In this way I get a lot of information from the market directly that I channel in the company and turn into concrete projects. These are two of the aspects that make my job so fascinating.

What developments have there been in surface metrology in the last few years?
There has been a radical change in the areas where material microscopes were traditionally applied. Light microscopes are still standard tools in routine applications like metallography and material analysis. However, scientists and engineers are always searching for new materials and structures with even better and more specific properties. In this context, fast and reliable measurement of surface structures is absolutely essential. This means that users need new measuring instruments. Also, inspection specifications for semiconductor materials are growing all the time: microscope users have to detect three-dimensional structures on a semiconductor wafer and measure them in the same work step.

Which contributions have come from Leica Microsystems?
We have the Leica DCM 3D dual core measuring microscope, which combines the two measurement techniques of confocal microscopy and interferometry in one instrument.

What are the current challenges in surface metrology?  

Users in quality assurance are often confronted with a wide variety of samples: some have extremely smooth surfaces, others comparatively rough ones. This means that different measurement techniques have to be used to get the best results. Developments in nanotechnology are also raising new challenges, as the techniques established for microstructures have limited application potential in the nanometer range.

To finish off with, a personal question: you took a degree in Japanese studies 3 years ago: why?

Japan has fascinated me ever since my student days. I wrote my dissertation in Tokyo 25 years ago. As a product manager, I naturally often went to Asia and to Japan in particular und so I finally decided to learn the language properly. The Asian business is important in my present job, too. It helps to be familiar with the culture as well as the language. Japan is still the world’s third largest market, and I am convinced that there’s still some unexplored potential for Leica Microsystems, too.

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