Product overview: Preparation of Geological Samples
Leica Microsystems offers the most comprehensive product portfolio for Electron Microscope Sample Preparation: for each step in the workflow you get a variety of instruments that meet the highest demands in technology and ergonomy and perfectly fit to each other. Get to know three Leica EM Sample Preparation products optimized for geological applications.
Leica EM TIC 3X - High-Quality Surface Finishing for Almost Any Material
Ion Beam Slope Cutting is often the only method capable of achieving high quality cross sections of hard, soft, porous, heat sensitive, brittle and/or heterogeneous material for scanning electron microscopy microstructure analysis and