Product overview: Preparation of Geological Samples

Leica EM TIC 3X - High-Quality Surface Finishing for Almost Any Material

Ion Beam Slope Cutting is often the only method capable of achieving high quality cross sections of hard, soft, porous, heat sensitive, brittle and/or heterogeneous material for scanning electron microscopy microstructure analysis and AFM investigations. The technology of the Leica EM TIC 3X surpasses conventional slope cutting instruments. With its three ion beams, cooling stage and multiple-sample stage, the Leica EM TIC 3X can mill at high rates, cut broad and deep into the sample and create smooth surfaces resulting in quality cross-sections for almost any material, quickly and easily.

The assembly is arranged perpendicular to the sample surface, so the sample (mounted on a holder) does not require an oscillating movement to reduce shadowing/curtaining effects. Up to three samples can be processed in one session. This makes the Leica EM TIC 3X a perfect instrument for high through-put laboratories.

Learn more about the Leica EM TIC 3X in a tutorial video, read the application notes and get an overview on the latest scientific publications using the Leica EM TIC 3X.

Target Surfacing System Leica EM TXP – Four Steps in One Instrument

The Leica EM TXP, a one-of-a-kind precision instrument for preparing cross sections, unites four machining technologies in one instrument: it saws, mills, grinds, and polishes material specimens for scanning electron microscopy (SEM) and incident light microscopy. This used to be a very time-consuming and difficult procedure as points of interest were easily missed and specimens often complex to handle due to their small size. With the Leica EM TXP these samples can be prepared with ease. Due to its versatility, the Leica EM TXP is a very efficient tool for sample pre-preparation prior to ion beam milling and ultramicrotomy.

Learn more about the Leica EM TXP in a tutorial video, read the application notes and get an overview on the latest scientific publications using the Leica EM TXP.

Ultramicrotome Leica EM UC7 – The New Standard in Sectioning

With its precision mechanics, ergonomic design, and intuitive layout of the touchscreen control unit the ultramicrotome Leica EM UC7 is an ideal instrument when quality semi- and ultra-thin sections, as well as perfectly smooth surfaces for LM, TEM, SEM, and AFM examination are required. Three independent, built-in, brightness-controlled LED light sources and the additional LED Spotlights provide outstanding illumination and improved visibility of the knife-specimen area. Dividing the diamond knife into segments with the 10.4" High End Controller ensures optimum usage of the complete length of the knife edge. You can easily download your user-, sample-, knife- and storage parameters via USB to Excel.

Learn more about the Leica EM UC7 in a tutorial video, and get an overview on the latest scientific publications using the Leica EM UC7.

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