As part of this years’ International Microscopy Congress (IMC), September 7 to 12 in Prague, Czech Republic, Leica Microsystems will present the latest innovations in live cell imaging, confocal microscopy, contrast methods and sample preparation for electron microscopy (EM), showing the triple ion beam cutter Leica EM TIC 3X and the cryo transfer system Leica EM VCT100 at booth #2. As one of the highlights, all visitors will get a first impression of our new sample preparation system Leica EM Cryo CLEM for correlative light and electron microscopy.
The International Microscopy Congress 2014 is one of the biggest international platforms for sharing knowledge and discussing all aspects of microscopy. A team of 12 Leica Microsystems’ specialists for nanotechnology and confocal will share their knowledge about contrast methods and the confocal laser scanning microscope Leica TCS SP8, and discuss all aspects of EM sample preparation for room temperature and cryo.
One of the highlights at our booth will be the presentation of the new Leica EM Cryo CLEM correlative light and electron microscopy system for correlating imaging and analysis of samples in their native state. The system includes cryo transfer and cryo light microscopy imaging with software connectivity to electron microscopes for mark and find function. A new Leica cryo objective with low working distance for higher resolution ensures fast and specific localization of target structure in EM.
As a part of the IMC preprogram, there will be a one-day workshop on September 6 on cryo FIB-SEM sample preparation in life sciences. Together with Tescan Orsay Holding, Leica Microsystems will guide all participants through the whole process from sample preparation to the final data rendering. In the morning, academic professionals will present lectures on fundamentals and recent research advances in the field of cryo FIB-SEM techniques. The afternoon session will focus on practical demonstrations, including high pressure freezing with the Leica EM HPM100, freeze facture, freeze etching, cryo coating with the Leica EM ACE600 and vacuum cryo transfer with the Leica EM VCT100. In collaboration with Bruker Nano, a second workshop on September 8 will deal with solutions on site-specific sample preparation for EBSD analysis. Dr. Laurie Palasse, Application Scientist for ESBD at Bruker Nano, and Robert Ranner, Product Manager LSD and LNT at Leica Microsystems, will prepare a perfect sample surface for ESBD measurement using gold wire bonds on silicon as a challenging application example.
To attend the workshop, please register on http://imc2014.com/index.php?page=gate.
To learn more about our wide range of EM sample preparation systems, follow the link to our Leica Microsystems Homepage on http://www.leica-microsystems.com/products/em-sample-prep/.
For more information about the congress and the program, follow the link to the IMC homepage on http://imc2014.com/index.php?page=home.