September 25 to 26, Leica Microsystems organizes a two-day workshop about non-contact 3D optical profilometry principles based on several confocal and interferometric techniques at the Engineering Department of the Università degli Studi Roma Tre in Rome, Italy. Prof. Edoardo Bemporad, professor of Materials Science and Technology and coordinator of the section of mechanical engineering of the University of Rome and Dr. Jordi Díaz, Head of the SPM Lab at the Science and Technology Centers (CCiT) of the University of Barcelona, will talk about different confocal microscopy and interferometry techniques. Additionally, Giancarlo Parma and Patrice Belin from Leica Microsystems will present the Leica DCM8 microscope solution for 3D measurement.
The first day of the workshop will be about roughness measurement: Dr. Jordi Díaz will give an introduction on roughness parameter applications and different 3D techniques. Patrice Belin, Sales Specialist Surface Metrology at Leica Microsystems, will talk about the importance of roughness measurement. The last presentation of the day will be about Leica Microsystems’ microscope solutions for 3D measurement, held by Giancarlo Parma, Sales Manager Leica Microsystems South Italy. The program will be completed by several practical case studies. All participants will also have the opportunity to exchange experiences and discuss challenges with our team of specialists.
On September 26, Prof. Edoardo Bemporad will give a talk about high-definition confocal microscopy as a booster for other characterization techniques. The last presentation of the two-day workshop will be about case studies at the Materials Science and Technology (STM) department, held by Marco Renzelli, Marco Sebastiani and Giuditta Montesanti.
The workshop will take place at LIME - Engineering Department c/o University "Roma TRE", Via Vasca Navale, 79, 00146 Rome, Italy. If you want to participate, please register on http://www.amiando.com/HIWOOHN.html?page=1150854.