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Highly accurate surface analysis is essential in multiple industrial and research environments today in order to ensure optimal performance of materials and components.
For the highest lateral resolution confocal microscopy is often the technique of choice, but interferometry is required to reach sub-nanometer vertical resolution, so which option to choose?
Leica Microsystems is proud to bring you the solution – the Leica DCM8
The versatile Leica DCM8 unites confocal microscopy and interferometry with large Field of View, intuitive software and true color imaging. Together these features enable you to acquire the full picture of each sample quickly, easily and precisely, communicate results clearly and thus optimize material performance.