Science Lab
Science Lab
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Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection for QC of materials like wafers can be challenging. Microscope solutions that offer several contrast methods enable fast and reliable defect detection and efficient workflows.
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Microscope Resolution: Concepts, Factors and Calculation
This article explains in simple terms microscope resolution concepts, like the Airy disc, Abbe diffraction limit, Rayleigh criterion, and full width half max (FWHM). It also discusses the history.
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A Brief History of Light Microscopy
The history of microscopy begins in the Middle Ages. As far back as the 11th century, plano-convex lenses made of polished beryl were used in the Arab world as reading stones to magnify manuscripts.…
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Total Internal Reflection Fluorescence (TIRF) Microscopy
Total internal reflection fluorescence (TIRF) is a special technique in fluorescence microscopy developed by Daniel Axelrod at the University of Michigan, Ann Arbor in the early 1980s. TIRF microscopy…
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Applications of TIRF Microscopy in Life Science Research
The special feature of TIRF microscopy is the employment of an evanescent field for fluorophore excitation. Unlike standard widefield fluorescence illumination procedures with arc lamps, LEDs or…