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Das Wissensportal von Leica Microsystems bietet Ihnen Wissens- und Lehrmaterial zu den Themen der Mikroskopie. Die Inhalte sind so konzipiert, dass sie Einsteiger, erfahrene Praktiker und Wissenschaftler gleichermaßen bei ihrem alltäglichen Vorgehen und Experimenten unterstützen. Entdecken Sie interaktive Tutorials und Anwendungsberichte, erfahren Sie mehr über die Grundlagen der Mikroskopie und High-End-Technologien - werden Sie Teil der Science Lab Community und teilen Sie Ihr Wissen!

Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection for QC of materials like wafers can be challenging. Microscope solutions that offer several contrast methods enable fast and reliable defect detection and efficient workflows.

Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.

Image of a Siemens star, where the diameter of the 1st black line circle is 10 mm and the 2nd is 20 mm, taken via an eyepiece of a M205 A stereo microscope. The rectangles represent the field of view (FOV) of a Leica digital camera when installed with various C-mounts (red 0.32x, blue 0.5x, green 0.63x).

Understanding Clearly the Magnification of Microscopy

To help users better understand the magnification of microscopy and how to determine the useful range of magnification values for digital microscopes, this article provides helpful guidelines.

[Translate to German:] Stereo microscopes are often considered the workhorses of laboratories and production sites.

Wichtige Faktoren, die Sie bei der Auswahl eines Stereomikroskops berücksichtigen sollten

Stereomikroskope zeichnen sich durch ihre Fähigkeit aus, einen 3D-Eindruck der Probe zu erzeugen. Daher eignen sie sich besonders gut für Inspektion und Nacharbeit, Qualitätskontrolle, Forschung und…

The Emspira 3 digital microscope offers what users need for comprehensive visual inspection, including comparison, measurement, and documentation sharing.

Digital Inspection Microscope for Industrial Applications

Factors users should consider before choosing a digital inspection microscope for industrial applications, including quality control (QC), failure analysis (FA), and R&D, are described in this…

Inspection microscope image of a printed circuit board (PCB) taken with a ring light (RL) and near vertical illumination (NVI).

Microscope Illumination for Industrial Applications

Inspection microscope users can obtain information from this article which helps them choose the optimal microscope illumination or lighting system for inspection of parts or components.

How Industrial Applications Benefit from Fluorescence Microscopy

Watch this free webinar to know more about what you can do with fluorescence microscopy for industrial applications. We will cover a wide range of investigations where fluorescence contrast offers new…

How to Use a Digital Microscope to Streamline Inspection Processes

Watch this webinar for inspiration and expert advice on how to make quality control simpler, quicker, and easier. Learn how to perform comprehensive visual inspection, including comparison,…

Introduction to 21 CFR Part 11 and Related Regulations

This article provides an overview of regulations and guidelines for electronic records (data entry, storage, signatures, and approvals) used in the USA (21 CFR Part 11), EU (GMP Annex 11), and China…