How to Easily Prepare Micro Targets for Electron Microscopy

Preparation of micro targets within microelectronics and other materials systems presents a significant challenge, as these targets are rarely visible. This causes the pinpointing and alignment of these targets to be difficult. Preparing exactly to the target is often a very time-consuming process and the targets can very easily be missed. In addition, specimens with micro targets tend to be small and difficult to handle.

Leica Microsystems has developed tools that facilitate easy preparation of micro targets. The EM TXP offers precise in situ mechanical preparation, which uses an integrated viewing system, allowing for viewing of the prepared surface at all stages of the process. Combining this process with the EM TIC3X broad ion beam milling system allows for targets to be prepared to an excellent quality finish for high resolution electron microscopy analysis. 

In this webinar, attendees will learn:

• How micro targets can be prepared mechanically using the Leica EM TXP target surfacing system, including a live demonstration on a real sample
• How pristine surfaces can be prepared though broad ion beam milling in the Leica EM TIC3X
• How to more efficiently prepare samples to reduce the necessary ion milling time through the synergy of the TXP-TIC3X workflow

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