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Leica EM TXP Ion Beam Milling Systems Leica Leica Microsystems

Sistema per il trattamento superficiale del target Leica EM TXP

  • Industria degli orologi microscopi

    Industria degli orologi microscopi

    Per i produttori e l'industria degli orologi l'alta precisione degli stereomicroscopi Leica facilita il delicato assemblaggio degli orologi e offre un'ispezione affidabile, a garanzia di alta qualità…
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  • Microscopi per le industrie automobilistica e dei trasporti

    Microscopi per le industrie automobilistica e dei trasporti

    L’ obiettivo di Leica è essere il vostro affidabile collaboratore che vi guida verso le soluzioni di imaging migliori per le vostre esigenze, per consentirvi di essere sempre un passo avanti alla…
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  • Microscopi per l'ingegneria dei metalli e delle macchine

    Microscopi per l'ingegneria dei metalli e delle macchine

    Chi lavora nell'ingegneria dei metalli e delle macchine ha bisogno di soluzioni di microscopia con imaging in grado di aiutare ad assemblare, controllare, misurare, analizzare e documentare i…
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  • Webinar: Quick 3D imaging of alloy defects

    Webinar: Quick 3D imaging of alloy defects

    Aluminum (Al) alloys play an important role in the production of aircraft and vehicles, as well as products in other industries. Defects present in the Al alloy used for the production of aircraft,…
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  • 3-Dimensional Imaging of Macroscopic Defects in Aluminum Alloys

    3-Dimensional Imaging of Macroscopic Defects in Aluminum Alloys

    The investigation of macroscale defects in aluminum (Al) alloys with a rapid 3-dimensional (3D) imaging approach is described in this report. Aluminum (Al) alloys play an important role in the…
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  • Cross Sectioning of Copper for Electron Backscattered Diffraction (EBSD)

    Cross Sectioning of Copper for Electron Backscattered Diffraction (EBSD)

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating diffraction patterns (Kikuchi-bands). It can be used for crystal orientation mapping,…
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  • Cross Sectioning of a Multilayer System - Preparation of a Perfect Sample Surface for EBSD

    Cross Sectioning of a Multilayer System - Preparation of a Perfect Sample Surface for EBSD

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping,…
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  • "Shallow Trench Isolation" Structures - Sample Preparation for TEM

    "Shallow Trench Isolation" Structures - Sample Preparation for TEM

    Application Note for Leica EM RES102 - The cross-sectional preparation of structured semiconductor materials requires a very thorough mechanical pre-preparation. In doing this, it must be ensured that…
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  • Metal Films and Sheets - Sample Preparation for TEM

    Metal Films and Sheets - Sample Preparation for TEM

    Application Note for Leica EM RES102 - Most metal films already have a thickness that requires no further mechanical pre-preparation. Frequently, however, they are also domed, which can lead to…
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  • Cross-Sectional Preparation of Structured Semiconductor Materials for TEM

    Cross-Sectional Preparation of Structured Semiconductor Materials for TEM

    Application Note for Leica EM RES102 - The vertical layer construction of a semiconductor structure should be examined as a TEM cross-sectional sample. In addition to the specific preparation of the…
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  • Cross Sectioning of Ni/Cu on Steel for EBSD

    Cross Sectioning of Ni/Cu on Steel for EBSD

    Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping,…
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  • Cross Sectioning of Painted Concrete

    Cross Sectioning of Painted Concrete

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cuts of material combinations consisting of hard and soft materials. Here, cross sectioning of painted…
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  • Cross Sectioning of a Superconductive Wire

    Cross Sectioning of a Superconductive Wire

    Application Note for Leica EM TIC 3X - Purpose: The shape of the wire is difficult for ion beam slope cutting. Goal: Cross sectional preparation to see the structure of the wire.
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  • Cross Sectioning of Alumina

    Cross Sectioning of Alumina

    Application Note for Leica EM TIC 3X - Alumina is very difficult to handle and almost impossible to prepare with conventional methods. Ion beam slope cutting is a method that can achieve cross…
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  • Cross Sectioning of CuSn Connector of a Solar Cell

    Cross Sectioning of CuSn Connector of a Solar Cell

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cross sections of soft materials or material combinations consisting of hard and soft components. The…
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  • Cross Sectioning of Oil Shale Rock

    Cross Sectioning of Oil Shale Rock

    Application Note for Leica TIC 3X - High quality sample preparation of large area to investigate the sample in the SEM. For the mechanical preparation step diamond lapping foils of 9μm subsequently…
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  • Inspection of Multilayer Coating in the Automotive Industry

    Inspection of Multilayer Coating in the Automotive Industry

    Today’s automotive industry use a variety of decorative and functional treatment to improve the vehicles surfaces. Traditional quality control methods to inspect these multilayer samples have proven…
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  • Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”

    Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”

    In 2014, the renowned Electron Microscopy for Materials Science (EMAT) research lab at the University Antwerp, Belgium, and Leica Microsystems started a fruitful collaboration to establish a Leica…
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  • A Good Place for Materials Scientists and Mineralogists to prepare their EM Samples

    A Good Place for Materials Scientists and Mineralogists to prepare their EM Samples

    In June 2014, the Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC) of the Université Pierre et Marie Curie in Paris became a Leica reference lab for EM Sample Preparation…
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  • High Quality Sample Preparation for EBSD Analysis by Broad Ion Beam Milling

    High Quality Sample Preparation for EBSD Analysis by Broad Ion Beam Milling

    Electron Backscatter Diffraction technique (EBSD) is known as a "surface" technique because electron diffraction is generated within a few tens of nanometers of the sample surface. Therefore, the…
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  • Preparation of Small Disk-shaped Samples for Capacitance and Pyroelectric Current Measurements

    Preparation of Small Disk-shaped Samples for Capacitance and Pyroelectric Current Measurements

    Capacitance and pyroelectric current measurements are best suited to determine important dielectric properties of materials, e.g. the relative dielectric constant, εr, and the remnant electric…
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  • Partner Lab for EM Sample Preparation in Paris

    Partner Lab for EM Sample Preparation in Paris

    At the Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC) of the Université Pierre et Marie Curie in Paris an new lab for EM Sample Preparation welcomes researchers of…
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  • A Word on Cathodoluminescence

    A Word on Cathodoluminescence

    Cathodoluminescence microanalysis is an emerging technique that is fast gaining popularity in the world of materials science. CL is a light emission phenomena resulting from the electron beam…
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  • University of Wollongong Electron Microscopy Centre

    University of Wollongong Electron Microscopy Centre

    The University of Wollongong has a diverse range of materials research programs that includes metallurgy for mining, manufacturing, steel making and transport; polymers for solar cells, energy storage…
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