Contatti
Leica EM TXP Ion Beam Milling Systems Leica Leica Microsystems

Sistema per il trattamento superficiale del target Leica EM TXP

Learn more about the Leica EM TXP Target surfacing System

The Leica EM TXP is a unique target preparation device especially developed for cutting, milling, drilling, grinding and polishing samples prior to examination by SEM, TEM and LM techniques.