Darkfield and brightfield microscopy
Leica Metallurgical Microscope systems use LED illumination for all contrast methods: brightfield (BF), darkfield (DF), differential interference contrast (DIC), qualitative polarization (POL), and fluorescence (FLUO) applications. It also offers built-in oblique illumination, which improves the visualization of surface topography and defects.
Ultra-bright, high-power LED illumination provides a constant color temperature of 4500º K for brightfield, darkfield, interference contrast, polarized light, and oblique illumination methods. It offers real color imaging at all intensity levels. Darkfield (DF) illumination causes flat surfaces to appear dark, as the vast majority of the light reflected at the high incident angle misses the interior of the objective lens. For samples having a flat surface with occasional non-flat features (cracks, pores, etched grain boundaries, etc.) the darkfield image shows a dark background with brighter areas corresponding to the non-flat features.
Leica’s materials microscopes combine high-quality Leica optics with state-of-the-art illumination. It is an ideal inspection tool for metallography, earth science, forensic investigation, and materials quality control and research.
Image, measure, and analyze features. Reveal hidden details of your samples with High-definition Darkfield illumination.