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Leica DM8000 M High Throughput 8" Inspection & Review System
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Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection for QC of materials like wafers can be challenging. Microscope solutions that offer several contrast methods enable fast and reliable defect detection and efficient workflows.
How to Boost your Microelectronic Component Inspection Performance
Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes?
Watch this free webinar…
Brief Introduction to Surface Metrology
This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also known as surface texture or surface finish. With…
Fields of Application
Semiconductor Inspection
Achieve fast and reliable wafer and semiconductor inspection for wafer processing, as well as IC packaging, assembly, and testing, with microscope and sample preparation solutions.
Industrial Microscopy Markets
Maximizing uptime and achieving targets efficiently help your bottom line. Leica microscope solutions can give you insights into the smallest sample details as well as analyze, document, and report…
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