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Leica EM RES102 Ion Beam Milling Leica Leica Microsystems

Ion Beam Milling System Leica EM RES102

TEM or SEM preparation - a matter of choice

To support the diverse range of application possibilities, the Leica EM RES102 can be equipped with a variety of sample holders for the preparation of TEM, SEM and LM samples. The load-lock system guarantees high sample throughput with fast sample exchange.

SEM

Sample Holder for the cleaning, polishing and contrast enhancement of SEM and LM samples at environment temperature or with LN2 cooling. The SEM holder allows to prepare a sample size up to 25mm diamter. An adapter is delivered to clamp commercial available SEM stubs with a 3.1mm diamter pin.

SEM

Slope Cutter Holder for the production of cross-sectional (90°) and angled sections (35°) for SEM investigation of vertical structures sample. Specimens can be prepared at environment temperature or with LN2 cooling.

SEM

SEM clamp holder to hold small samples with maximum dimensions of 5 (H) x 7 (W) x 2 (D) mm. This holder can be easily transferred directly to the SEM without removing the sample.

TEM

Sample Holder (Quick Clamp Holder) for single and double-sided low angle milling down to 4°.

TEM

Cooling Holder for the preparation of temperature-sensitive samples in combination with the LN2 cooling device.

FIB

Cleaning holder used to reduce the amorphizised layer of a FIB sample.