Albert S. Laforet , M.S.
Albert Laforet is a scientific and Product Manager in the Innovation team for Metrology at Leica Microsystems. He has more than 7 years of experience in the field of Optical Metrology. He has presented multiple times different topics concerning metrology at international conferences and exhibitions worldwide. For his master’s thesis, he developed a new confocal tracking sensor for shape measurement of optical surfaces. He manages different products related to surface measurements which are sold worldwide. He also constantly works together with R&D to improve and optimize the products to satisfy todays challenging customer needs. He has expertise with various types of measurement microscopy technologies. In the past, he studied Electronic and Mechanical Engineering and has an international master’s degree in Photonics from the Polytechnic University of Catalonia in Barcelona, Spain.
Automated topographic analysis with the Leica Map software
Watch this video to learn how you can save time when doing topographic analysis using the Leica Map software. The software allows you to go quickly from automated analysis of multiple sets of acquired…Read article
Brief Introduction to Surface Metrology
This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also known as surface texture or surface finish. With…Read article