James M. Marr , PhD

James joined Leica Microsystems as an advanced workflow specialist covering Leica’s widefield product line in 2019. During his time at the National Institute of Standards and Technology (NIST), James leveraged advanced microscopy to develop and employ robust applications including: automated particle identification and extraction, widefield lifetime measurements, and super-resolution single-molecule imaging.

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james.marr@leica-microsystems.com

Widefield Microscopy
The Power of Pairing Adaptive Deconvolution with Computational Clearing
Deconvolution is a computational method used to restore the image of the object that is corrupted by the point spread function (PSF) along with sources of noise. In this technical brief, learn how the…
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Feb 16, 2021
Whitepaper
Widefield Microscopy
An Introduction to Computational Clearing
Many software packages include background subtraction algorithms to enhance the contrast of features in the image by reducing background noise. The most common methods used to remove background noise…
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Oct 01, 2020
Whitepaper

James M. Marr , PhD

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The Power of Pairing Adaptive Deconvolution with Computational Clearing

An Introduction to Computational Clearing