Patrice Belin is a Surface Metrology Specialist for Leica Microsystems in Europe since February 2014. He has a Master of Science degree in Materials & Applied Physics with a specialization in Semiconductor Engineering from INSA (Institut National des Sciences Appliquées) in Lyon, France. He then joined the company KLA-Tencor as an Application Engineer for western Europe, being a specialist for overlay, CD-SEM, and macro-defect detection equipment. In addition, on occasion, he gave support to colleagues and customers in Germany, the USA, and South Korea. After gaining some experience in research financing and process management, he worked as a Pre-Sales, Application & Project Manager at the company Altimet, a main company in the field of surface metrology.