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Gisela Höflinger


Gisela Höflinger is Product Manager for EM-Sample Preparation in Vienna, Austria. She holds a degree in industrial engineering and has started at Leica Microsystems as a Junior Product Manager in January 2011. Since December 2012 she is Product Manager and responsible for the Leica EM ACE coater line.

  • Visualization of DNA Molecules

    Precise low angle rotary shadowing with heavy metals (like platinum) can be used in transmission electron microscopy (TEM) to observe molecular details of objects previously absorbed on a thin, low grain and electron-transparent carbon film. To achieve the highest contrast and better image quality, it is essential that the coating is directional, and it is given at a precise angle toward the sample. The fine grain of the metal layers and the homogeneous thickness of the coating material all over the sample surface are also crucial requirements to achieve high quality TEM images. This requires the method of e-beam evaporation a stream of evaporated material which is very directional, extremely homogeneous, cool and fine grained.
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  • How to Clean a Coater

    Coating of samples is required in the field of electron microscopy to enable or improve the imaging of samples. Compared to the traditional coater design, all parts of a Leica EM ACE Coater can be individually removed and cleaned or, if special cleanliness is needed, even exchanged for spare parts.
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  • Brief Introduction to Freeze Fracture and Etching

    Freeze fracture describes the technique of breaking a frozen specimen to reveal internal structures. Freeze etching is the sublimation of surface ice under vacuum to reveal details of the fractured face that were originally hidden. A metal/carbon mix enables the sample to be imaged in a SEM (block-face) or TEM (replica). It is used to investigate for instance cell organelles, membranes, layers and emulsions.
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  • Brief Introduction to Coating Technology for Electron Microscopy

    Coating of samples is required in the field of electron microscopy to enable or improve the imaging of samples. Creating a conductive layer of metal on the sample inhibits charging, reduces thermal damage and improves the secondary electron signal required for topographic examination in the SEM.
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  • Carbon Thickness Evaluation in Electron Microscopy

    The coating layers applied and used for electron microscopy imaging are commonly controlled and measured by quartz crystals. These crystals oscillate with a certain frequency (around 6 megahertz when new). By measuring the frequency before coating and after coating, the specific weight of the coating material and the geometric position of the quartz, the applied thickness can be calculated.
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