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Frédéric Leroux, PhD

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Frédéric Leroux completed his Master degree in Biology in 2007 at the University of Ghent where he gained experience in biological EM sample preparation. In 2008, he moved to the physics department at the University of Antwerp where he started his PhD. At the EMAT research group he specialized in advanced electron microscopy of composite materials. 2016, he joined Leica Microsystems as Application Specialist Nanotechnology EMEA.

He received his PhD in 2012. After 2 years as a postdoctoral researcher he became EM sample preparation specialist at EMAT. He thereby uses his multidisciplinary background and broad microscopy experience to improve EM sample preparation of a variety of materials (polymers, composites, biological and industrial materials).

  • Free Webinar On-Demand: Revealing Cellular Dynamics with Millisecond Precision

    What if you can dissect the cellular dynamics with millisecond precision? What if you can unravel the morphological transformation of a neuron millisecond by millisecond using electron microscopy?
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  • Carbon Coating for Polymeric Materials

    Application Note fo Leica EM ACE600 - A solid understanding of polymer property-structure relationships is critical to improve and shorten development routes to new products. A direct way to determine correlations between structure and mechanical properties is provided by electron microscopy. Electron microscopy techniques have an important advantage over other methods, as they can provide local information at high spatial resolution. However, a major problem with polymers is their inherent lack of contrast.
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  • High-Resolution Carbon Coating: How much Carbon is too much?

    Application Note for Leica EM ACE600 - Carbon support films are routinely used for high resolution TEM. Thickness is one of the main criteria to assess its usefulness for a particular experiment. Within that respect graphene (oxide) layers are frequently used. However, charge dissipation and mechanical stability towards high probe currents and high voltages, including long term acquisition protocols are equally important.
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  • Each Atom Counts: Protect Your Samples Prior to FIB Processing

    Application Note for Leica EM ACE600 - Focused ion beam (FIB) technology has become an indispensable tool for site-specific TEM sample preparation. It allows to extract electron transparent specimens with nanometer precision using a focused Ga+ ion beam.
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  • Ultra-thin Carbon Support Films for Improved STEM-EELS Analysis of Nanoparticles

    Application Note for Leica EM ACE600 - Recent developments in aberration corrected transmission electron microscopes as well as further improvements in monochromaters and spectrometers have pushed the attainable energy resolution for Electron energy loss spectroscopy (EELS) to 100 meV and beyond. STEM-EELS of individual nanomaterials can be challenging due the necessity of a support film.
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  • Ways to Reveal More from your Samples: Ultra-Thin Carbon Films

    Application Note for Leica EM ACE600 - Much of the battle involved in obtaining good transmission electron microscopy data is in the specimen preparation itself. Even though some nanomaterials are already electron transparent (e.g. nanoparticles and proteins) and often do not require further thinning procedures, they need to be dispersed onto thin support films.
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  • Webinar: Sample Preparation of Nanocomposites and Nanomaterials by Ultramicrotomy - a Powerful Alternative to FIB

    In this webinar the sample preparation workflow including the Ultramicrotome Leica EM UC7, its cryo-chamber Leica EM FC7 and the pre-preparation system Leica EM TXP will be given. The main part of this webinar will cover tips and tricks to reveal the internal structure of composites and materials being investigated with TEM and STEM. Differences between Focused Ion Beam (FIB) and Ultramicrotomed samples will be shown and explained.
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  • TEM Sample Preparation Made Easy - Prepare TEM Specimen by Broad Beam Argon Ion Milling

    Quantitative and analytical analysis at high spatial resolution places stringent demands on the quality of the produced TEM specimens. Pristine and high-quality samples are indispensible for atomic resolution TEM analysis. In this application note a general procedure for obtaining cross-sectional and plan-view TEM specimens using the Leica EM RES102 ion milling system is outlined. The procedure described below can be easily adapted for a large range of materials e.g. thin film materials, semiconductors, multilayered materials, ceramics, superconductors, …
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  • Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”

    In 2014, the renowned Electron Microscopy for Materials Science (EMAT) research lab at the University Antwerp, Belgium, and Leica Microsystems started a fruitful collaboration to establish a Leica Reference Site in Antwerp. This site, officially opened in July 2014, is dedicated to specimen preparation for electron microscopy in materials science with a special focus on ion beam milling and recently also on carbon coating. In this interview Prof Gustaf van Tendeloo, Director of EMAT, and Frédéric Leroux, TEM specimen preparation specialist, talk about research topics at EMAT, how the Leica reference site has evolved, and future trends for EM sample preparation.
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