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Robert Ranner


Robert Ranner, Product Manager EM Specimen Preparation at Leica Microsystems, Nanotechnology Division. He is responsible for solid state preparation instruments. Robert has ten years application experience in industrial sample preparation for TEM, SEM.

  • Cross Section of an Aluminium Sample for Electron Backscattered Diffraction (EBSD)

    Application Note for Leica EM TIC020, Leica EM TIC 3X - Electron backscattered diffraction (EBSD) is for example used to examine the crystallographic orientation of material. The sample preparation for such samples is sometimes very tricky as the depth of information is just few nm (~20nm or less). That means the sample surface must be flat and free of preparation artefacts. Mechanical polishing leads mostly to sample surfaces damages.
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  • Cross Sectioning of Oil Shale Rock

    Application Note for Leica TIC 3X - High quality sample preparation of large area to investigate the sample in the SEM. For the mechanical preparation step diamond lapping foils of 9μm subsequently 2μm and finally 0.5μm grain size were used. It took about 1.5 hours. The sample was removed from the stub with a razor blade after TXP processing and fixed onto the holder of the rotary stage of the Leica EM TIC 3X.
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  • Webinar: Sample Preparation of Nanocomposites and Nanomaterials by Ultramicrotomy - a Powerful Alternative to FIB

    In this webinar the sample preparation workflow including the Ultramicrotome Leica EM UC7, its cryo-chamber Leica EM FC7 and the pre-preparation system Leica EM TXP will be given. The main part of this webinar will cover tips and tricks to reveal the internal structure of composites and materials being investigated with TEM and STEM. Differences between Focused Ion Beam (FIB) and Ultramicrotomed samples will be shown and explained.
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  • Brief Introduction to Specimen Trimming

    Before ultrathin sectioning a sample with an ultramicrotome it has to be pre-prepared. For this pre-preparation, special attention must be paid to the sample size (size of the section), location of the sample (targeting) and accuracy of the block-face edges. This process is generally called trimming, wherein the sample is shaped mainly to a frustum of a pyramid.
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  • Brief Introduction to Ultramicrotomy

    The usual thicknesses for transmission electron microscopic examinations range between 20 nm and 150 nm. Ultramicrotomy is a fast and clean method of producing ultra-thin sections of biological samples as well as polymers, rubber, ductile and even hard and brittle materials. A key advantage of ultramicrotomy is the size and homogeneity of the electron-transparent area of specimens prepared with this technique.
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  • Webinar: SEM Sample Preparation Using Ion Beam Slope Cutting

    ASM International and Leica Microsystems presented this free webinar on how to achieve high quality cross-sections of any material. Revealing the internal structures of the sample with scarcely any deformation or damage remains an industry challenge. New technologies allow for production of cross sections of hard/soft, porous, heat sensitive, brittle and heterogeneous material for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations. Learn how you can achieve high quality cross-sections during this free webinar.
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