Preparation Conditions
1. Step (Cleaning):
| Acceleration voltage: | 4 kV |
| Gun current: | 2 mA |
| Sample movement: | 70° Oscillation |
| Milling angle: | 10° |
| Milling Time: | 10 min |
2. Step (Polishing):
| Acceleration voltage: | 6 kV |
| Gun current: | 2.5 mA |
| Sample movement: | Rotation |
| Milling angle | 5° |
| Milling Time: | 20 min |
(Images: FEM Schwäbisch Gmünd)
Results
Fig. 1 shows the sample surface after mechanical polishing. One can see some scratches. The information concerning the grain structure is very weak. There are just some grains visible. The surface looks ”foggy”. The sample surface looks much better after ion milling. The real grain structure and structural details are clearly visible now. The milling procedure could remove the smeared material that covered the real sample structure. The cleaning step was followed by an additional polishing step to remove possible surface roughness.
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