Ion Milling:
| Parameter / Step | |
|---|---|
| Acceleration voltage | 6 kV |
| Gun current | 2 mA |
| Milling time | 5 h |
Results:
- Flat and clean cross section of the superconductive wire
- Structure of Nb3Sn in the Cu matrix
Cross Sectioning of a Superconductive Wire
Application Note for Leica EM TIC 3X - Industrial Manufacturing
Purpose: The shape of the wire is difficult for ion beam slope cutting.
Goal: Cross sectional preparation to see the structure of the wire.
Process Description: (benchmark values for this particular sample)
Mechanical pre-preparation:
1. Embedding in between two Si slices
2. Grinding the cross section with the Leica EM TXP
(6µm diamond foil) to get a flat surface
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