Story

Cross Sectioning of Rubber (Tire)

Application Note for Leica EM TIC 3X - Industrial Manufacturing

Purpose
Ion beam slope cutting is a method that can achieve cross sections of soft materials or material combinations consisting of hard and soft components.

Goal
Preparation of a flat cross section for SEM and AFM.

Process Description
(benchmark values for this particular sample)Mechanical pre-preparation: The soft sample was cut with razor blade.

Parameter
Acceleration voltage8 kV
Gun current3 mA
Milling time3 h
Cooling-70°C


Results

  • The cross section is flat and clean.
  • The components of rubber-like carbon and SiO2 are visible.
  • The rubber shows disruptions. EM TIC 3X preparation revealed disrubtions of the rubber sample.

Download PDF

Authors

Topics & Tags

Interested to know more?

Talk to our experts. We are happy to answer all your questions and concerns.

Contact Us

Do you prefer personal consulting?

  • Leica Microsystems Inc.
    1700 Leider Lane
    Buffalo Grove, IL 60089 United States
    Office Phone : +1 800 248 0123
    Service Phone : 1 800 248 0223
    Fax : +1 847-236-3009

You will find a more detailed list of local contacts here.