Bert Willems studied Physics at the University of Antwerp, in the Faculty of Science and at Research group for Electron microscopy for materials science (EMAT). After his PhD, he worked as a R&D project leader in diamond research where he expanded his expertise in imaging and spectroscopy methods. Since the beginning of 2014, he provides sales support and training in our Advanced Workflow Solutions Group for Microscopy, Imaging and Metrology Solutions in the German speaking DACH Region for Leica Microsystems.
- Reliable inspection across multiple users: Guide operators with step-by-step work instructions to make consistent decisions about potential defects.
- More efficient reporting: Replace manual reporting steps with automated data storage and report generation to reduce potential sources of error.
- Be prepared for specific regulations like the 21 CFR Part 11 & EU GMP Annex 11 and GxP Good