Contact & Support

Fast Visual and Chemical Analysis of Contamination and Underlying Layers

Material Inspection with a 2-Methods-in-1 Solution Combining Microscopy and Laser Spectroscopy

Visual and chemical analysis of contamination on materials with a 2-methods-in-1 solution leading to an efficient, more complete analysis workflow is described in this report. A 2-in-1 solution, combining optical microscopy and laser induced breakdown spectroscopy (LIBS), in addition to simultaneous visual and chemical inspection, can be used to quickly remove contamination and inspect the underlying base material.

Authors

Topics & Tags

Table of Content

Content

For inspection of components or parts, such as soldering and leads on printed circuit boards (electronics) or metal panels on vehicles (automotive and transport), understanding the effects of contamination are important. Significant cost and time savings for material analysis can be achieved when exploiting a 2-in-1 solution.

The ability to make confident decisions quickly during production, inspection, quality control, failure analysis, or research and development depends greatly on the rapid availability of relevant, accurate, and reliable materials data.

Register to Download Report

*
*
*
*
*
*
*
*
I hereby give Leica Microsystems and their affiliates permission to provide me with information about their products and services. I understand that I may be contacted by phone, SMS or email.
By clicking on the SUBMIT button, I confirm that I have reviewed and agree with Leica Microsystems Terms of Use and their Privacy Policy. I also understand my privacy choices as they pertain to my personal data, as detailed in the aforementioned Privacy Policy under ‘’Your Privacy Choices’’.