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Fast Visual and Chemical Analysis of Contamination and Underlying Layers

Material Inspection with a 2-Methods-in-1 Solution Combining Microscopy and Laser Spectroscopy

Visual and chemical analysis of contamination on materials with a 2-methods-in-1 solution leading to an efficient, more complete analysis workflow is described in this report. A 2-in-1 solution, combining optical microscopy and laser induced breakdown spectroscopy (LIBS), in addition to simultaneous visual and chemical inspection, can be used to quickly remove contamination and inspect the underlying base material.


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For inspection of components or parts, such as soldering and leads on printed circuit boards (electronics) or metal panels on vehicles (automotive and transport), understanding the effects of contamination are important. Significant cost and time savings for material analysis can be achieved when exploiting a 2-in-1 solution.

The ability to make confident decisions quickly during production, inspection, quality control, failure analysis, or research and development depends greatly on the rapid availability of relevant, accurate, and reliable materials data.

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