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Free Webinar-on-Demand: Mechanical pre-preparation and ion milling for SEM observation

The right combination to hit your target

See how the unique combination of pre-preparation system and ion milling system makes fast site specific sample preparation for Scanning Electron Microscopy or optical microscopy possible.

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Introduction

Discover how keeping the sample in the same holder and observing the sample during the full preparation process will dramatically improve your sample preparation lead time.

Find out why sample preparation choice is crucial for sample analysis and will describe further ion beam milling application illustrations.

Target Audience

  • SEM users
  • Engineers and researchers from companies and academics working with material samples such as polymers, multi-layers samples, electronics, stones, etc
  • Material scientists already working with Ion Beam Milling

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