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  • C. Elegans

    Work Efficiently in Developmental Biology with Stereo and Confocal Microscopy: C. elegans

    For scientists, technicians, and teachers working with the worm C. elegans in the research lab or classroom, this report is intended to give useful information to help improve their daly work. The aim is to make the work steps of worm picking, transgenesis, RNA interference, screening, and functional imaging efficient. It also details the various possibilities for equipping a research worm lab or biology classroom/teaching lab explaining worm methods.
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  • Cross Section of an Aluminium Sample for Electron Backscattered Diffraction (EBSD)

    Application Note for Leica EM TIC020, Leica EM TIC 3X - Electron backscattered diffraction (EBSD) is for example used to examine the crystallographic orientation of material. The sample preparation for such samples is sometimes very tricky as the depth of information is just few nm (~20nm or less). That means the sample surface must be flat and free of preparation artefacts. Mechanical polishing leads mostly to sample surfaces damages.
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  • Ion Beam Polishing of Sample Surfaces - Sample Preparation for SEM

    Application Note for Leica EM RES102 - Ion milling can be used to reduce the roughness of sample surfaces. Small angles less than 6° with respect to the sample surface are necessary. The high voltage depends on the material to be prepared. The reason for the levelling effect is the different milling angle of flat and rough surface areas. The milling rate is lower for small angles. The rough surface area will be faster milled. Ion polishing is often the final step of sample preparation. The prerequisite is a perfect mechanical prepreparation as samples with deep surface scratches cannot be ion polished. Soft materials usually have a smeared sample surface after mechanical polishing. It is necessary to remove this smeared material before ion polishing. Otherwise the above mentioned polishing effect does not work.
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  • Cleaning of Smeared Sample Surfaces - Sample Preparation for SEM

    Application Note for Leica EM RES102 - Mechanical polishing of soft materials or hard / soft material combinations is tricky. The mechanical polishing process leads very often to smearing of the soft material. The smeared material covers the surface and fills small pores or holes. Grain structures, interfaces and other structural details can be masked. An additional ion milling step with milling angles between 10° C and 15° C with respect to the sample surface can remove or reduce the contamination.
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  • How to Analyze Prepared and Unprepared Geological Samples with One Digital Microscope

    Polarized light microscopes have been used in classical earth science studies for the last 100 years. Since then a lot of progress has been made to increase the user friendliness, ergonomy, and optical performance of such microscopes. Still, one thing has not changed: Classical polarized light (compound) microscopes can only be used for prepared samples, because the working distance they offer is insufficient for whole samples. This article explains how earth scientists can analyze prepared and unprepared samples for polarized light applications with one single instrument, namely the Leica DVM6 M digital microscope. With the right choice of accessories it serves as a semi-quantitative polarization microscope.
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  • Ceramics - Sample Preparation for TEM

    Application Note for Leica EM RES102 - Ceramic samples are mostly very brittle, and are therefore very difficult to thin mechanically to a low starting thickness for ion beam milling. The ion beam milling of insulators often leads to static charging of the surface of the sample. This, in turn, reduces the sputter rate. When using the Ti standard holder (standard TEM holder), however, sufficient secondary electrons are created by the ion beam also falling on the sample holder to largely compensate for the static charging.
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  • Cross Sectioning of Alumina

    Application Note for Leica EM TIC 3X - Alumina is very difficult to handle and almost impossible to prepare with conventional methods. Ion beam slope cutting is a method that can achieve cross sections of material combinations consisting of hard and soft components.
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  • Webinar on Demand: High Pressure Freezing With Leica EM ICE - The Tool For Understanding Dynamic Processes

    In this webinar, we will introduce the features and applications of the Leica EM ICE high pressure freezer with light stimulation, emphasizing the physics and technical solutions behind the user interface. We will discuss parameters such as dwell time, pressure and temperature correlation, how they are measured and what the displayed data means. We will also explain how light stimulation is synchronized with the freezing process to give you millisecond precision in your experiments.
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  • Cross Sectioning of CuSn Connector of a Solar Cell

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cross sections of soft materials or material combinations consisting of hard and soft components. The CuSn connector is very soft. Mechanical polishing leads to smearing.
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  • Cross Sectioning of Oil Shale Rock

    Application Note for Leica TIC 3X - High quality sample preparation of large area to investigate the sample in the SEM. For the mechanical preparation step diamond lapping foils of 9μm subsequently 2μm and finally 0.5μm grain size were used. It took about 1.5 hours. The sample was removed from the stub with a razor blade after TXP processing and fixed onto the holder of the rotary stage of the Leica EM TIC 3X.
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  • "The excellent red reflex, combined with the IOL guidance system, makes it possible for me to work quickly and precisely during refractive procedures."

    Excellent red reflex as well as maximum accuracy throughout the entire procedure are required to meet these expectations. Dr. Ulrich Jung, Medical Director at the ARTEMIS eye clinic in Dillenburg, Germany, tested the Proveo 8 ophthalmological microscope from Leica Microsystems in combination with the positioning system IOLcompass Pro for intraocular lenses at his clinic. In this interview, Dr. Jung reports his experiences.
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  • Cryo-SEM Imaging of Latex Paint

    Application Note for Leica EM VCT100, Leica EM ACE600 - A thin layer of latex paint was spread on a clean, scored, silicon chip. The sample was immediately plunge frozen in liquid ethane and transferred under LN2 to the Leica EM VCT100 loading station where it was placed in the customized sample holder.
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  • Cross Sectioning of Rubber (Tire)

    Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve cross sections of soft materials or material combinations consisting of hard and soft components.
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  • Webinar: Laser Microdissection in Cancer Research – Contamination-free Isolation of Tumor Material for Downstream Analysis

    In this webinar you will learn about the advantages of using laser mikcrodissection for precise, contamination-free isolation of specific cell types in various applications. Using pancreatic cancer tissue sections from patients and ortothopic xenografts as examples, this webinar will provide an overview of the scientific and practical considerations for obtaining highly pure material for further molecular analysis in the field of pharmacological studies to overcome key mechanisms of resistance in pancreatic cancer.
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  • Workflows & Protocols: Plant Laser Microdissection

    During Leica workshops for LMD users in Brazil, hosted by the Federal University of Paraná/UFPR (UFPR) at the Centro de Energia Nuclear na Agricultura/USP (CENA), the power of laser microdissection using the Leica LMD systems was demonstrated. One special focus was on plant dissection which needs a high laser power.
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  • Inspection of Multilayer Coating in the Automotive Industry

    Today’s automotive industry use a variety of decorative and functional treatment to improve the vehicles surfaces. Traditional quality control methods to inspect these multilayer samples have proven to be extremely time-consuming and bear the risk of missing defects. A new approach combining a target surface system and a light microscope offers new possibilities of speed and reliability. F. Javier Ruiz Balbas, Laboratory Manager at Atotech Spain, explains his experiences with the system.
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  • Circuit board inspection

    Fast and Reliable Inspection of Printed Circuit Boards with Digital Microscopy

    Digital microscopy has been used more and more for inspection, quality control and assurance (QC/QA), failure analysis (FA), and research and development (R&D) in the microelectronics industry, especially for printed circuit boards (PCBs). Digital microscopes are practical to use and allow an efficient workflow for inspection.
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  • Cross Sectioning of Basalt Fibres

    Application Note for Leica EM TIC 3X - Material Research. Purpose: The fibres are embedded in a soft matrix. That makes it difficult to prepare a cross section. Goal: Cross section of the basalt fibres.
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  • Quantifying the Resolution of a Leica SR GSD 3D Localization Microscopy System with 2D and 3D Nanorulers

    DNA origami based nanorulers produced by GATTAquant are common standards to test the achievable spatial resolution of super-resolution microscopes. Recently the nanorulers were used to test the performance of the Leica SR GSD 3D microscope.
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  • Workflows & Protocols: Laser Microdissection for Pathology and Cancer Research

    Tumor development results from mutations in our DNA. For their deeper analysis, cancer researchers have to dissect the relevant tissue areas. Here we report the reason why laser microdissection is a perfect tool for this purpose and how this was taught in the course of a workshop held in Brazil. With the Leica LMD system pure tumor material can be selected and dissected for downstream analysis to ensure 100% pure starting material without any risk of cross contamination with healthy cells.
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  • Webinar: Get the Most Out of Digital Microscopy

    From routine quality assurance to advanced 3D analysis of complex surface structures, there is a digital microscope solution to meet almost any request
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  • Automotive Industry: How Suppliers and Auto Manufacturers Can Verify Parts Specifications Quickly and Easily

    Checking specifications is critical: During the manufacture of auto parts, specifications must be met – whether by the auto parts supplier or the automobile manufacturer. It is important that the parts meet specifications as they are critical for maintaining the performance standards and safe operation of automobiles, trucks, and other vehicles during their lifetimes.
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  • Six Features to Consider when Choosing a Dental Microscope

    In dental medicine, the surgical microscope has become increasingly important for high-quality and successful surgeries, particularly in the field of endodontics. A microscope supports the dentist to conduct micro-invasive surgeries which aim to preserve the tooth substance, conserve the tissue, minimize the risks and reduce healing time. To choose the microscope that best fits the dentist’s needs, it is helpful to know some of the decisive features of a modern dental microscope.
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