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Scientific Volume Imaging (SVI), Hilversum, The Netherlands

Started in 1994, Scientific Volume Imaging (SVI) is the sole independent company in the world that offers high quality restoration (deconvolution) and analysis software for confocal, widefield & brightfield, Spinning disk, Multi-photon, and STED microscopy, with fully automatic depth-dependent PSF measurement as well as bead-based PSF measurement.

SVI is based in Hilversum (The Netherlands) and has a very clear mission statement: "To provide reliable, high quality, easy to use image processing tools for scientists working in light microscopy. Together with a dedicated team in close contact with the international scientific microscopic community, we continuously improve our software, keeping it at the forefront of technology." 

The Huygens software is suited for beginners and advanced users with its wizards and scripting possibilities. With the Huygens Core, SVI takes the lead in facilitating web-based and high-throughput deconvolution and analysis allowing users to perform image processing from their own computer at anytime and at any place. All Huygens software products can be freely tested for 30 days by requesting a free trial version at

www.svi.nl

  • Measuring the 3D STED-PSF with a new Type of Fluorescent Beads

    A new type of fluorescent bead is presented by GATTAquant. These beads, called GATTA-Beads, are characterized by a small diameter (23 nm), high intensity and size uniformity. In combination with state-of the-art STED microscopes such as the Leica TCS SP8 STED 3X and high-end image restoration methods available in the Huygens Software, it is shown that these new beads can be used for accurate STED PSF characterization in 3D. Furthermore, it is shown that the measured 3D STED-PSF can be used to improve image restoration quality in combination with STED deconvolution methods available in the Huygens Software.
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  • Video Tutorial: STED Parameters and STED Deconvolution

    Scientific Volume Imaging has a leading role in deconvolution with the Huygens STED deconvolution option, that takes the specific properties of the STED PSF into account. Huygens is compatible with data from pulsed, CW, and CW-gated STED systems, and reads the microscopic parameters automatically from these Leica LIF files. Most recently, Huygens is also able to handle data from the novel Leica TCS SP8 STED 3X, which can obtain super-resolution in both lateral (x,y) and axial (z) directions.
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  • Huygens STED Deconvolution Increases Signal-to-Noise and Image Resolution towards 22 nm

    STED microscopy has proven to be a valuable super-resolution technique, resolving objects that are smaller than the diffraction-limited resolution. Deconvolution of STED images with Huygens pushes the resolution even further. In a recent publication (see link below), we demonstrate that Huygens offers a two-fold improvements of STED images in X, Y, and Z resolution, and increases signal-to-noise ratios eight times. The presented data also shows that a lateral resolution increase from 50 nm towards 22 nm was obtained by applying Huygens deconvolution on (biological) gated-STED images. Furthermore, we describe that stabilization of 3D STED images is essential for optimal deconvolution, as it corrects for lateral drift which would normally distort the structure of the STED PSF.
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  • Abstracts of the 2nd European Super-Resolution User-Club Meeting

    The 2nd meeting of the Leica Super-resolution User club was held from September 25 to 27, 2012 in collaboration with the Science for Life Laboratory at the Karolinska Institute, Stockholm, Sweden. With a mixture of engaging talks by key experts in the field of super-resolution microscopy and stimulating discussion sessions, the meeting proved as popular as last year’s event, attracting a wide range of scientists interested in both confocal and widefield super-resolution and sample preparation techniques.
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