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University of Anwerp, Electron Microscopy for Materials Science (EMAT), Belgium

www.uantwerpen.be/en/rg/emat/

  • Webinar: Sample Preparation of Nanocomposites and Nanomaterials by Ultramicrotomy - a Powerful Alternative to FIB

    In this webinar the sample preparation workflow including the Ultramicrotome Leica EM UC7, its cryo-chamber Leica EM FC7 and the pre-preparation system Leica EM TXP will be given. The main part of this webinar will cover tips and tricks to reveal the internal structure of composites and materials being investigated with TEM and STEM. Differences between Focused Ion Beam (FIB) and Ultramicrotomed samples will be shown and explained.
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  • TEM Sample Preparation Made Easy - Prepare TEM Specimen by Broad Beam Argon Ion Milling

    Quantitative and analytical analysis at high spatial resolution places stringent demands on the quality of the produced TEM specimens. Pristine and high-quality samples are indispensible for atomic resolution TEM analysis. In this application note a general procedure for obtaining cross-sectional and plan-view TEM specimens using the Leica EM RES102 ion milling system is outlined. The procedure described below can be easily adapted for a large range of materials e.g. thin film materials, semiconductors, multilayered materials, ceramics, superconductors, …
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  • Electron Microscopy Sample Preparation: “The Future is Cold, Dynamic and Hybrid”

    In 2014, the renowned Electron Microscopy for Materials Science (EMAT) research lab at the University Antwerp, Belgium, and Leica Microsystems started a fruitful collaboration to establish a Leica Reference Site in Antwerp. This site, officially opened in July 2014, is dedicated to specimen preparation for electron microscopy in materials science with a special focus on ion beam milling and recently also on carbon coating. In this interview Prof Gustaf van Tendeloo, Director of EMAT, and Frédéric Leroux, TEM specimen preparation specialist, talk about research topics at EMAT, how the Leica reference site has evolved, and future trends for EM sample preparation.
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