Leica Science Lab - Tag : PCB https://www.leica-microsystems.com//science-lab/tag/pcb/ Article tagged with PCB en-US https://www.leica-microsystems.com/15854 Digital Microscopy Quality Assurance Surface Metrology Digital Microscopy with Versatile Illumination and Various Contrast Methods for More Efficient Inspection and Quality Control State-of-the-art digital microscopes utilizing a versatile illumination system capable of achieving multiple contrast methods, such as the Leica DVM6, are very useful for inspection, quality control, and failure analysis. These contrast methods allow flaws or defects on the surface of a product or component to be more easily and rapidly detected. https://www.leica-microsystems.com/science-lab/digital-microscopy-with-versatile-illumination-and-various-contrast-methods-for-more-efficient-inspection-and-quality-control/ Mon, 16 Jan 2017 10:53:00 +0000 PhD James DeRose, Georg Schlaffer https://www.leica-microsystems.com/17945 Digital Microscopy Quality Assurance Digital Microscopy Used in Microelectronics and Electronics Quality Control Quality Control in the electronics and microelectronics industry is confronted with many challenges: A variety of different materials in a sample, some of them metallic and reflective, some matt; a variety of material layers and heights, most often very intricate and hard to discern. Users in microelectronics quality control seek to identify deviations from the standard and improve the production processes so that defects are minimized or even eliminated. https://www.leica-microsystems.com/science-lab/galleries/image-gallery-digital-microscopy-used-in-microelectronics-and-electronics-quality-control/ Thu, 19 May 2016 11:23:00 +0000 PhD James DeRose, Claudia Müller https://www.leica-microsystems.com/17398 Quality Assurance Digital Microscopy Inspecting and Analyzing Printed Circuit Boards Quickly and Reliably with a Digital Microscope For the past several years, digital microscopy has been shown to be useful for inspection, quality control and assurance (QC/QA), and failure analysis (FA) in the microelectronics industry, especially for printed circuit boards (PCBs). Recently, state-of-the-art improvements have made digital microscopy even more powerful and practical for inspection, leading to a more efficient workflow. Here, the advantages of certain digital microscope features, i.e., intuitive software for operation and analysis, fast and easy ways to change magnification, and encoding for reliable recall of parameters, are explained. https://www.leica-microsystems.com/science-lab/inspecting-and-analyzing-printed-circuit-boards-quickly-and-reliably-with-a-digital-microscope/ Mon, 11 Jan 2016 09:09:00 +0000 PhD James DeRose, Georg Schlaffer https://www.leica-microsystems.com/10864 Stereo Microscopy Quality Assurance Higher Motivation, Longer Concentration – Ergonomics as a Competitive Advantage Sensor and identification technology, industrial cameras: when top precision is required, the name Baumer Electric is soon mentioned. The Swiss company designs and produces components for manufacturing facilities all over the world. To be able to guarantee that the finished components are of the highest possible quality, elaborate quality inspections are carried out part for part under the stereo microscope. https://www.leica-microsystems.com/science-lab/higher-motivation-longer-concentration-ergonomics-as-a-competitive-advantage/ Tue, 01 Oct 2013 09:38:00 +0000 Michael Birlenbach, Remo Holenstein https://www.leica-microsystems.com/5350 Stereo Microscopy Quality Assurance FusionOptics – Combines high resolution and depth of field for ideal 3D optical Images A study carried out jointly by Leica Microsystems and the Institute of Neuroinformatics at the University of Zurich and Swiss Federal Institute of Technology provided the basis for an innovation in stereomicroscopy: FusionOptics™. The significant performance increase attained by FusionOptics™ is highly valuable for everyday work at the microscope. https://www.leica-microsystems.com/science-lab/fusionoptics-combines-high-resolution-and-depth-of-field-for-ideal-3d-optical-images/ Thu, 17 Apr 2008 22:00:00 +0000 Daniel Goeggel, Dipl. oec.-troph. Anja Schué, Dr. Daniel Kiper